Mini-SEM (Tabletop Scanning Electron Microscope) (Evex)

Mini-SEM (Tabletop Scanning Electron Microscope) (Evex) Scanning Electron Microscope Evex – NanoAnalysis Spectral Module Advanced Imaging Elemental Mapping Evex Mobile Cart

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling. This video is part 4 of a 6-part series. More information on the CMDITR wiki: depts.washington.edu
Video Rating: 5 / 5

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